|Keywords:||UCTD; Superconducting magnets; Electromagnets; Magnetic circuits; Magnetic fields – Measurements|
|Full text PDF:||http://hdl.handle.net/10019.1/98674|
ENGLISH ABSTRACT: Ambient magnetic fields, trapped flux and fields generated by bias and ground return currents affect superconducting electronic circuits negatively. Analysis of current distribution in bias lines and in ground return paths gives us the ability to predict the behaviour of magnetic fields. This work investigates the calculation of magnetic fields around superconducting integrated circuit structures from current density data, both for the interleaved uni-axial segment meshes of the FastHenry and FFH numerical solvers, as well as the more general tetrahedral and triangular meshes of more versatile electromagnetic solvers. A tool called MagnetEx is proposed, which gives the user a variety of visualization methods both for magnetic fields and current distribution. The result is a practical analysis tool with which the cause and effects of stray coupling or compromised shielding efficiency can be identified quickly and visually in superconducting circuit layouts. AFRIKAANSE OPSOMMING: Geen opsomming beskikbaar Advisors/Committee Members: Fourie, C. J., Stellenbosch University. Faculty of Engineering. Dept. of Electrical and Electronic Engineering..