AbstractsComputer Science

A Raman and scanning electron microscope analysis of magnetron sputtered thin-film carbon

by Jonathan Laumer




Institution: University of British Columbia
Department: Electrical and Computer Engineering
Degree: Master of Applied Science - MASc
Year: 2015
Record ID: 2058868
Full text PDF: http://hdl.handle.net/2429/51893


Abstract

Thin-film carbon coatings possess properties, such as extreme hardness, smoothness, and a nice glossy finish, that make them desirable for a variety of industrial and military applications. This thesis examines the Raman spectra associated with thin-films of carbon that are prepared using magnetron sputtering. The goal is to achieve a high amount of strong bonds, i.e., sp³ bonds, as in diamond, using this inexpensive and widely available deposition process. Raman spectroscopy is the chosen analytical method used for the purpose of this work, since it is non-destructive and widely available. Using Raman spectroscopy, an sp³ content of up to 77 % is determined. This suggests that it is possible to deposit thin-films of carbon that approach the properties of tetrahedral amorphous carbon, a material known for its excellent hardness and durability, using this inexpensive approach. A scanning electron microscope image of one of the thin-films of carbon is acquired and examined, conclusions regarding the transition between the underlaying titanium substrate and the thin-film of carbon being drawn. Further directions for possible research are mentioned.